Description
Title: L X-ray Emission from a Thick Polycrystalline Tungsten Element Induced by 15–25 keV Electrons: Impact Energy and Angular Dependence
Abstract: Using a Si PIN photodiode detector, the impact energy and angular dependence of L X-rays from a thick polycrystalline tungsten (W; atomic number, Z = 74) target were measured at various angles ranging from 15 to 75 at intervals of 5. It is discovered that the measured variation of the relative intensities of the Ll, L, L, and L characteristic lines as a function of incidence angle is anisotropic, and the measured variation compares favorably with the outcomes of the PENELOPE simulation. While the angular variation of the L/L ratio exhibits almost isotropic distribution within measurement uncertainty, the angular variation of the intensity ratios Ll/L and L/L exhibit anisotropic distribution. It is discovered that these measured ratios and Monte Carlo (MC) calculations agree quite well. However, the measured intensity ratio of Ll/L exhibits a non-linear variation with the impact energy and yields poor agreement with theoretical calculations. The measured intensity ratios of L/L and L/L at a given incidence angle show a linear dependence with impact energy and exhibit good agreement with simulation results.
Keywords: impact energy and angular dependence; L X-ray lines;MC simulation; anisotropic distribution
Paper Quality: SCOPUS / Web of Science Level Research Paper
Subject: Physics
Subject Category: Atomic and Molecular Physics, and Optics
Writer Experience: 20+ Years
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